Description: Tencor Surfscan 6220
(Surfscan 6220)
Tencor 6220 Particle Counter
* Capable of 2" -8" wafers * Non-patterned Surface Inspection System * .09 micron defect sensitivity @ 80% capture, based on PSL Standards. * 0.02 ppm haze sensitivity. 0.002 ppm haze resolution. * Accuracy within 1%. * XY coordinates. * Refurbished to OEM specifications.
NOTE: You can view the process specifications for this tool by clicking the "More Details" tab below.
|