Description: Dektak 8000 Profilometer
(Dektak 8000)
DEKTAK Model 8000 Surface profiler, 200 mm sample stage, 1A resolution at 65 kA, Windows interface. This benchtop model provides step heights and microroughness for semiconductor wafers, magnetic disks, sliders and thin film heads. Maximum 65,400 data points per scan for high horizontal resolution. Stable baseline provides superior measurement repeatability. Programmable X-Y-Theta stage. Programmable automated sequence with multiple scans at multiple locations.
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