Nanometrics 215-Nanometrics Nanospec AFT 215-Sitek Process Solutions Inc.

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Product Details

Manufacturer:	Nanometrics	Email Us Want to Service Want to Sell Related Products
Mfg. Part#:	Nanometrics 215
Condition:	Refurb
Asking Price:	Contact Sales
Inventory Number:	148

Description: Nanometrics Nanospec AFT 215 (Nanometrics 215)

Nanometrics 215 Automated Film Thickness Tool.

* Cassette to cassette operation. 3¿ to 6¿ wafer capability.
* Measurement spot size 5 ¿m to 50 ¿m.
* Up to 500 measurements per wafer in mapping mode.
* Measures from 100 angstrom to 50,000 angstroms.

Note: See below for detailed specifications on the Nanometrics 215

		Specifications

Specification Url
Nanometrics Nanospec AFT 215 Specifications	Nanometrics Nanospec AFT 215 Specifications

Due to equipment location and/or prior sale, some pictures are used for "reference only."

Sitek Process Solutions, Inc. Phone: 916.797.9000 Fax: 916.797.9009
233 Technology Way, Building A-3, Rocklin, CA 95765.
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