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Current: Catalog : Tencor Surfscan 4000 wafer particle counter (Surfscan 4000 Particle Counter)


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Manufacturer: Tencor Email Us
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Mfg. Part#: Surfscan 4000 Particle Counter
Condition: Used
Asking Price: Contact Sales
Inventory Number: 53572

Description: Tencor Surfscan 4000 wafer particle counter (Surfscan 4000 Particle Counter)

Tencor 4000 Wafer Particle Counter

* Used to measure particles on bare silicon wafers.
* Particle sensitivity: 0.3um with 95% detection probability.
* Haze sensitivity: 1 PPM.
* Spatial resolution: 50 um particle spacing between defects.
* Substrate sizes 3" to 6".
* Measurement time for a 6" substrate: 30 seconds.
* Measurement modes: Automatic, Manual or One-Wafer.
* Light source: Helium-neon laser 2 mW, wavelength = 6328
* System will be fully refurbished. * Looks and runs great.



Tencor Surfscan 4000 wafer particle counter






Specifications







Patterned / Unpatterned wafers Unpatterned 
Repeatability  
Resolution .3 microns @95% capture based on latex calibration wafers 
Substrate Material Silicon 
Substrate Thickness SEMI standard wafer thickness from 0.3 - 0.75mm 
Substrate size 100, 125, 150mm 
Thruput upto 60 wafers/hour 
Specification Url  



Due to equipment location and/or prior sale, some pictures are used for "reference only."
Sitek Process Solutions, Inc. Phone: 916.797.9000 Fax: 916.797.9009
233 Technology Way, Building A-3, Rocklin, CA 95765.
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