Description: Tencor Surfscan 4000 wafer particle counter
(Surfscan 4000 Particle Counter)
Tencor 4000 Wafer Particle Counter
* Used to measure particles on bare silicon wafers. * Particle sensitivity: 0.3um with 95% detection probability. * Haze sensitivity: 1 PPM. * Spatial resolution: 50 um particle spacing between defects. * Substrate sizes 3" to 6". * Measurement time for a 6" substrate: 30 seconds. * Measurement modes: Automatic, Manual or One-Wafer. * Light source: Helium-neon laser 2 mW, wavelength = 6328 * System will be fully refurbished. * Looks and runs great.
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