Nanometrics 50-II CD-Nanometrics Nanoline 50-II CD Measurement System-Sitek Process Solutions Inc.

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Product Details

Manufacturer:	Nanometrics	Email Us Want to Service Want to Sell Related Products
Mfg. Part#:	Nanometrics 50-II CD
Condition:	Used
Asking Price:	Contact Sales
Inventory Number:	52254

Description: Nanometrics Nanoline 50-II CD Measurement System (Nanometrics 50-II CD)

Nanometrics Nanoline 50-II CD Measurement System

- Model Nanoline 50-II, Main System
- Capable of Measuring up to 4" Wafers
- 10X Eyepieces
- 5x, 20x and 50x objectives
- Less than 5 Seconds Scan Time
- From 5 to 25 seconds focus time
- Nanoline Computer Controller
- Keyboard
- System Monitor
- Full and complete system, guaranteed operational

		Specifications

Specification Url

Due to equipment location and/or prior sale, some pictures are used for "reference only."

Sitek Process Solutions, Inc. Phone: 916.797.9000 Fax: 916.797.9009
233 Technology Way, Building A-3, Rocklin, CA 95765.
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