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Description: ADE 6033T Thickness Gauges
(ADE Microsense 6033T)
MicroSense 6033T
* The Model 6033T,using ADE's patented capacitive
measurement principle, measures wafers for Thickness
and Total Thickness Variation (TTV).
* Whenever semiconductor wafer inspection is required,
the MicroSense Model 6033T offers a low cost method
of achieving fast, accurate measurements.
* Measure wafes up to 6" (150mm) in diameter.
* Non-contact
* All-electronic gaging
* Fast set-up
* Easy operation
* Measures thickness
* Measures total thickness variation (TTV)
11-7-16 - JIM. We have one 6033 and on 6033T in stock.See "More details" below for a detailed specification sheet.
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