Gaertner L125B elllipsometer-Gaertner Dual Wavelength Mapping System-Sitek Process Solutions Inc.

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Product Details

Manufacturer:	Gaertner	Email Us Want to Service Want to Sell Related Products
Mfg. Part#:	Gaertner L125B elllipsometer
Condition:	New
Asking Price:	Contact Sales
Inventory Number:	51033

Description: Gaertner Dual Wavelength Mapping System (Gaertner L125B elllipsometer)

Gaertner Dual Wavelength Mapping System (L125B)

* He-Ne 6328A red laser
* He-Cd 4416A blue laser
* Auto gain
* Microspot optics
* 6" vacuum stage
* 0-60,000A film thickness range
* Measures plasma nitrides
* Silicon on saphire
* Absolute thickness order of thick films
* Possible options: PC interface & software, monitor

		Specifications

Specification Url

Due to equipment location and/or prior sale, some pictures are used for "reference only."

Sitek Process Solutions, Inc. Phone: 916.797.9000 Fax: 916.797.9009
233 Technology Way, Building A-3, Rocklin, CA 95765.
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