Description: Rudolph FTM ellipsometer
(Rudolph FTM ellipsometer)
Rudolph FTM ellipsometer
*Precise: 1nm resolution *Fast Operation: 4 seconds per measurement *Set film type, dial, insert sample, and measure *Nondestructive: Non contact optical system *Optical thickness: 300nm to 5,000nm *Refractive Index Range: 1.000 to 9.999 *Spot Size: 2 x 6mm
***Please see below under "more Detail" for a complete product specification sheet
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