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Current: Catalog : Prometrix FT-650 (Prometrix FT-650)


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Manufacturer: Prometrix Email Us
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Mfg. Part#: Prometrix FT-650
Condition: Refurb
Asking Price: Contact Sales
Inventory Number: 50649

Description: Prometrix FT-650 (Prometrix FT-650)

Prometrix FT-650

* Film Thickness Mapping System
* Measures single or multiple layers or oxide, nitride,
   photoresist, polysilican and other optical transparent films.
* Measurement capabilities from 100 angstom to greater that 
   4 microns.
* Analysis capabilities: Mapping: Die, Contour, 3-D maps.
* Scanning: Diameter scan
* Sampling: Quick tests, user definable tests
* Cassette to cassette wafer handling
* Measurement capabilities:
   * Measurement: Film thickness, reflexivity.
* Spot sizes: 4um to 80um
* Number of layers: Up to 3
* Standard wafer sizes: 3, 3.25" and 100, 125, 150, 200mm.
* Interface Serial# 9101F6
* Probe station serial # 9104F7
* Elevator Station # 911C4FT
* Olypmus objectives: MS PLan 2.5x, 5x, 10x, 20x and a ULWD
   MS plan 50x
* Mfg in 1990


 Prometrix FT-650






Specifications







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Due to equipment location and/or prior sale, some pictures are used for "reference only."
Sitek Process Solutions, Inc. Phone: 916.797.9000 Fax: 916.797.9009
233 Technology Way, Building A-3, Rocklin, CA 95765.
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