Manufacturer:	Nanometrics		Email Us Want to Service Want to Sell Related Products
Mfg. Part#:	Nanometrics 210
Condition:	Refurb
Asking Price:	Contact Sales
Inventory Number:	50284

Description: Nanometrics Nanospec AFT 210 (Nanometrics 210)

Nanometrics AFT 210
* Nanometrics 210
* Film Measurement System
* Stage - dual 4" wafers - larger stage can be supplied
* Range of Thicknesses: 100 to 500,000 angstroms,
* Spot Size: 50 um with 5x objective, 25 um with 10x 
   objective, 6.5 um with 40x objective
* System includes an Olympus M10x and M40x objective.
* Optional Objectives are Olympus M5X and M100X
* Film Types: Oxide on Silicon; Nitride on Silicon; Negative
   Resist on Silicon; Polysilicon on Oxide; Negative Resist on
   Oxide; Nitride on Oxide; Polyimide on Silicon; Positive Resist
   on Silicon; Positive Resist on Oxide
* Reflectance Mode
* Thick Films, Reproducibility: 5A ± 5% depending upon the
   film type
* Typical Measurement Time: 2.5 seconds.

* Pictures may be used for reference only

Note: Our current system in stock does not have the autoloader. Just a manual load stage.