Description: Nanometrics Nanospec AFT 210XP
(Nanospec AFT 210XP)
Nanometrics Nanospec AFT 210XP Film Measurement System.
*System is in excellent "like new" condition. *Readu for immediate shipment. *Range of Thicknesses: 100 to 500,000 angstroms *Spot Size: 50 um with 5x objective, 25 um with 10x objective 50 um with 50x objective *Film Types: Oxide on Silicon; Nitride on Silicon; Negative Resist on Silicon; Polysilicon on Oxide; Negative Resist on Oxide; Nitride on Oxide; Polyimide on Silicon; Positive Resist on Silicon; Positive Resist on Oxide; *Reflectance Mode; Thick Films, Reproducibility: 2A ¿ depending upon the film type, *Typical Measurement Time: 2.5 seconds.
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