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Current: Catalog : Nanometrics Nanospec AFT 210XP (Nanospec AFT 210XP)


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Manufacturer: Nanometrics Email Us
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Mfg. Part#: Nanospec AFT 210XP
Condition: Refurb
Asking Price: Contact Sales
Inventory Number: 50283

Description: Nanometrics Nanospec AFT 210XP (Nanospec AFT 210XP)

Nanometrics Nanospec AFT 210XP Film Measurement System.

*System is in excellent "like new" condition.
*Readu for immediate shipment.
*Range of Thicknesses: 100 to 500,000 angstroms
*Spot Size: 50 um with 5x objective, 25 um with 10x objective
 50 um with 50x objective
*Film Types: Oxide on Silicon; Nitride on Silicon; Negative  
 Resist on Silicon; Polysilicon on Oxide; Negative Resist on
 Oxide; Nitride on Oxide; Polyimide on Silicon; Positive Resist
 on Silicon; Positive Resist on Oxide;
*Reflectance Mode; Thick Films, Reproducibility: 2A ¿
  depending upon the film type,
*Typical Measurement Time: 2.5 seconds.


Nanometrics Nanospec AFT 210XP






Specifications







Specification Url  
Nanometrica 210 XP specification Nanometrica 210 XP specification  



Due to equipment location and/or prior sale, some pictures are used for "reference only."
Sitek Process Solutions, Inc. Phone: 916.797.9000 Fax: 916.797.9009
233 Technology Way, Building A-3, Rocklin, CA 95765.
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