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Current: Catalog : Tencor Surfscan 6220 (Surfscan 6220)


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Manufacturer: Tencor Email Us
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Mfg. Part#: Surfscan 6220
Condition: Refurb
Asking Price: Contact Sales
Inventory Number: 50022

Description: Tencor Surfscan 6220 (Surfscan 6220)

Tencor 6220 Particle Counter

* Capable of 2" -8" wafers
* Non-patterned Surface Inspection System
* .09 micron defect sensitivity @ 80% capture, based on PSL Standards.
* 0.02 ppm haze sensitivity. 0.002 ppm haze resolution.
* Accuracy within 1%.
* XY coordinates.
* Refurbished to OEM specifications.

NOTE: You can view the process specifications for this tool by clicking the "More Details" tab below.



Tencor Surfscan 6220






Specifications







Patterned / Unpatterned wafers Unpatterned 
Repeatability  
Resolution 0.10um diameter latex spheres on a polished silicon wafer with 90% detection probability. 
Substrate Material Any opaque, polished surface that scatters less than 5% of the incident light. 
Substrate Thickness SEMI standard wafer thickness from 0.3 - 0.75mm 
Substrate size 100, 125, 150 and 200mm 
Thruput 150 wafers per hour (150mm) 
Specification Url  
Tencor 6220 particle counter Tencor 6220 particle counter.jpg  



Due to equipment location and/or prior sale, some pictures are used for "reference only."
Sitek Process Solutions, Inc. Phone: 916.797.9000 Fax: 916.797.9009
233 Technology Way, Building A-3, Rocklin, CA 95765.
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