Nanospec AFT 181-Nanometrics Nanospec AFT 181-Sitek Process Solutions Inc.

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Product Details

Manufacturer:	Nanometrics	Email Us Want to Service Want to Sell Related Products
Mfg. Part#:	Nanospec AFT 181
Condition:	Refurb
Asking Price:	Contact Sales
Inventory Number:	4147

Description: Nanometrics Nanospec AFT 181 (Nanospec AFT 181)

Computerized Film Thickness Measurement Nanometrics 181. Microspectrophotometer head can measure in wavelength range 480-790 nm. Standard films measured silicon dioxide and nitride, negative and positive resists, nitrides, oxides, and polymides. Measures from 400A to 40,000A.

		Specifications

Specification Url
Nano 180/181 Spec's	Nanometrics 180-181 specifications.tif

Due to equipment location and/or prior sale, some pictures are used for "reference only."

Sitek Process Solutions, Inc. Phone: 916.797.9000 Fax: 916.797.9009
233 Technology Way, Building A-3, Rocklin, CA 95765.
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