Description: Tencor Surfscan 7600
(Surfscan 7600)
Tencor 7600 Partical Inspection System
* Delivers critical defect data quickly. * A multi-thresholding capability allows a virtually unlimited number of data collection thresholds to be established for different regions of the device. * Substrate sizes: 100, 125, 150, 200 mm diameter wafers. * Sensitivity: 0.15 um. * Repeatability: Count error ;eaa than 1.5% on a standard deviation
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