Description: Estek WIS 8500
(WIS 8500)
Detection 0.17 um on Silicon at 95% capture rate. Verified by NIST Standards. 2 to 8 inch capable with proper setup. Dark channel system. Dark channel is used for detecting particles and any light scattering defects. Built-In computer to store wafer data and images. Argon Ion 488nm laser. Remanufactured system to factory production specifications.
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