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Current: Catalog : Nanometrics Nanospec AFT 215 (Nanometrics 215)


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Manufacturer: Nanometrics Email Us
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Mfg. Part#: Nanometrics 215
Condition: Refurb
Asking Price: Contact Sales
Inventory Number: 148

Description: Nanometrics Nanospec AFT 215 (Nanometrics 215)

Nanometrics 215 Automated Film Thickness Tool.
 
* Cassette to cassette operation. 3¿ to 6¿ wafer capability.
* Measurement spot size 5 ¿m to 50 ¿m.
* Up to 500 measurements per wafer in mapping mode.
* Measures from 100 angstrom to 50,000 angstroms.

Note: See below for detailed specifications on the Nanometrics 215


Nanometrics Nanospec AFT 215






Specifications







Specification Url  
Nanometrics Nanospec AFT 215 Specifications Nanometrics Nanospec AFT 215 Specifications  



Due to equipment location and/or prior sale, some pictures are used for "reference only."
Sitek Process Solutions, Inc. Phone: 916.797.9000 Fax: 916.797.9009
233 Technology Way, Building A-3, Rocklin, CA 95765.
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