Description: Nanometrics Nanospec AFT 181
(Nanospec AFT 181)
Computerized Film Thickness Measurement Nanometrics 181 with Auto loader. Microspectrophotometer head can measure in wavelength range 480-790 nm. Standard films measured silicon dioxide and nitride, negative and positive resists, nitrides, oxides, and polymides. Measures from 400A to 40,000A.
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